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Sondrel to present at NMI Test Conference
20 October 2008
Patrick Richier, Engineering Manager, will present at the DfM Technical Network Event ‘Designing for Test’ hosted by the National Microelectronics Institute. Patrick will be presenting a new technique for optimising transition fault test patterns in nanometer IC designs, which will result in improved test coverage and reduced cost.
The presentation will be taking place at Chilford Hall, Cambridge, UK, on 22nd October 2008. For more information see http://www.nmi.org.uk/events/DfM_Event_221008.htm
The Queens Award for Enterprise: Innovation 2009
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